The investigation of spray pyrolysis grown CdS thin films doped with flourine atoms
dc.authorid | Yilmaz, Salih/0000-0002-3006-4473 | |
dc.contributor.author | Yilmaz, Salih | |
dc.date.accessioned | 2025-01-06T17:36:56Z | |
dc.date.available | 2025-01-06T17:36:56Z | |
dc.date.issued | 2015 | |
dc.description.abstract | Undoped and F-doped CdS thin films were succesfully grown on the glass substrates by the spray prolysis method. X-ray diffraction results showed that all the samples had hexagonal wurtzite structure with the (1 0 1) preferred orientation. It was found from scanning electron microscopy that an increase in the grain size was observed after F-doping. The band gap value of CdS thin films increased from 2.38 eV to 2.42 eV with the increase of F concentration from 0 to 6 at.%. The intensity of room temperature photoluminescence spectrum of undoped CdS thin films enhanced with the increment of F-doping amount that is related to the increase of point defects formed by the flourine atoms. Electrical measurements showed that the carrier concentration increased from 1.93 x 10(12) cm(-3) to 7.62 x 10(12) cm(-3) when CdS thin films were doped with 2 at.% F. However, further increase in F amount up to 6 at.% caused a decrease in the carrier concentration. On the other hand, resistivity value first decreased from 1.26 x 10(5) SZ cm to 8.54 x 10(4) SZ cm with the increase of F-doping up to 2 at.% and then increased to 1.65 x 10(5) SZ cm for 6 at.% F-doping. It can be concluded that 2 at.% F-doped CdS thin films exhibited the best electrical and optical properties, which is suitable for the application of thin film solar cells. (C) 2015 Elsevier B.V. All rights reserved. | |
dc.identifier.doi | 10.1016/j.apsusc.2015.09.098 | |
dc.identifier.endpage | 879 | |
dc.identifier.issn | 0169-4332 | |
dc.identifier.issn | 1873-5584 | |
dc.identifier.scopus | 2-s2.0-84949843995 | |
dc.identifier.scopusquality | Q1 | |
dc.identifier.startpage | 873 | |
dc.identifier.uri | https://doi.org/10.1016/j.apsusc.2015.09.098 | |
dc.identifier.uri | https://hdl.handle.net/20.500.14669/2038 | |
dc.identifier.volume | 357 | |
dc.identifier.wos | WOS:000366216900115 | |
dc.identifier.wosquality | Q1 | |
dc.indekslendigikaynak | Web of Science | |
dc.indekslendigikaynak | Scopus | |
dc.language.iso | en | |
dc.publisher | Elsevier | |
dc.relation.ispartof | Applied Surface Science | |
dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | |
dc.rights | info:eu-repo/semantics/closedAccess | |
dc.snmz | KA_20241211 | |
dc.subject | CdS: F | |
dc.subject | Thin films | |
dc.subject | SEM | |
dc.subject | Carrier concentration | |
dc.subject | Resistivity | |
dc.title | The investigation of spray pyrolysis grown CdS thin films doped with flourine atoms | |
dc.type | Article |