Experimental and Theoretical Study of Defect Evolution in InSb Epilayers under Gamma Irradiation: A Comparative Analysis of MOCVD vs MBE Growth Methods

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dc.authoridSoares Archanjo, Braulio/0000-0001-8145-7712
dc.authoridCôrtes Derc, Alex/0009-0009-6849-9374
dc.authoridNascimento Lima, Erika/0000-0002-0670-9737
dc.contributor.authorMarroquin, John Fredy Ricardo
dc.contributor.authorDerc, Alex Cortes
dc.contributor.authorNascimento Lima, Erika
dc.contributor.authorde Oliveira, Igor Saulo Santos
dc.contributor.authorGunes, Mustafa
dc.contributor.authorAkyol, Mustafa
dc.contributor.authorArchanjo, Braulio S.
dc.contributor.authorde Azevedo, Walter M.
dc.contributor.authorHenini, Mohamed
dc.contributor.authorFelix, Jorlandio Francisco
dc.date.accessioned2026-02-27T07:33:34Z
dc.date.available2026-02-27T07:33:34Z
dc.date.issued2025
dc.description.abstractThe operational requirements of high-radiation and extraterrestrial environments highlight the need to evaluate narrow-bandgap semiconductors that remain unexplored under such conditions, among them Indium Antimonide (InSb). As a material system, InSb offers unparalleled electron mobility and a massive g-factor, making it indispensable for next-generation infrared detection, Hall sensing, and topological quantum computing architectures. However, the practical realization of these devices is frequently hindered by the necessity of heteroepitaxial growth on lattice-mismatched substrates, typically Gallium Arsenide (GaAs), which introduces a complex landscape of threading dislocations and interfacial defects. This report presents an exhaustive, multimodal investigation into the radiation hardness of InSb epilayers, specifically contrasting the microstructural evolution of films grown via Metal-Organic Chemical Vapor Deposition (MOCVD) against those synthesized by Molecular Beam Epitaxy (MBE). Utilizing an experimental framework that integrates Electron Paramagnetic Resonance (EPR), Raman spectroscopy, High-Resolution Scanning Transmission Electron Microscopy (HR-STEM), and ab initio Density Functional Theory (DFT), this study elucidates the mechanistic divergence in radiation response between the two growth methodologies. The data reveal a critical, counterintuitive trade-off: the MOCVD-grown material, despite exhibiting superior initial crystalline quality driven by a zinc-doped seed layer that passivates interfacial traps, demonstrates a heightened susceptibility to electronic degradation and stoichiometry violation under high-fluence Gamma (gamma) irradiation. In contrast, the MBE-grown material, initially marred by a higher density of dislocations, exhibits a complex survivability mode at elevated doses, characterized by defect saturation. This report details the atomic-level physics driving these behaviors, including the radiation-induced formation of homopolar Sb-Sb bonds, the symmetry-breaking anisotropy of the g-factor, and the thermodynamic instability of dopant-passivated interfaces under nonequilibrium conditions. Furthermore, these findings can be used as actionable engineering guidelines for Radiation Hardness Assurance (RHA), proposing novel nondestructive spectroscopic metrics for the qualification of semiconductors destined for space and nuclear applications.
dc.description.sponsorshipConselho Nacional de Desenvolvimento Cient?fico e Tecnol?gico [305394/2021-5]; Funda??o de Apoio ? Pesquisa do Distrito Federal [193-00002418/2023-08]; Funda??o de Amparo ? Ci?ncia e Tecnologia do Estado de Pernambuco [APQ-1219-1.06/24]
dc.description.sponsorshipThe authors thank CENAPAD. J.F.F. and J.F.R.M. acknowledge financial support from CNPq (Grant No. 309610/2021-4) and the Fundacao de Apoio a Pesquisa do Distrito Federal (FAPDF; Grant No. 193-00002418/2023-08). W.A. acknowledges support from FACEPE (Grant No. APQ-1219-1.06/24) and CNPq (Grant No. 305394/2021-5). The authors are grateful to Akira Yoshikawa and Naohiro Kuze (Asahi Kasei Corporation) for kindly supplying the samples.
dc.identifier.doi10.1021/acsomega.5c10490
dc.identifier.endpage63487
dc.identifier.issn2470-1343
dc.identifier.issue51
dc.identifier.pmid41487224
dc.identifier.startpage63474
dc.identifier.urihttp://dx.doi.org/10.1021/acsomega.5c10490
dc.identifier.urihttps://hdl.handle.net/20.500.14669/4639
dc.identifier.volume10
dc.identifier.wosWOS:001639250900001
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakPubMed
dc.language.isoen
dc.publisherAmerican Chemical Society
dc.relation.ispartofACS Omega
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/openAccess
dc.snmzKA_20260302
dc.titleExperimental and Theoretical Study of Defect Evolution in InSb Epilayers under Gamma Irradiation: A Comparative Analysis of MOCVD vs MBE Growth Methods
dc.typeArticle

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