Effect of Ta insertion between Pt and CoFeB on interfacial magnetic anisotropy in Pt/CoFeB/MgO multilayer thin-film stack

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dc.authoridKivrak, Burak/0000-0002-6785-7346
dc.authoridAkyol, Mustafa/0000-0001-8584-0620
dc.authoridEkicibil, Ahmet/0000-0003-3071-0444
dc.contributor.authorAkyol, Mustafa
dc.contributor.authorKivrak, Burak
dc.contributor.authorTumen, Kutluhan Utku
dc.contributor.authorEkicibil, Ahmet
dc.date.accessioned2025-01-06T17:45:05Z
dc.date.available2025-01-06T17:45:05Z
dc.date.issued2020
dc.description.abstractThe effect of a thin Ta layer inserted between Pt and CoFeB layers on perpendicular magnetic anisotropy (PMA) with MgO barrier layer has been studied. The crystallinity was studied by performing high-resolution x-ray diffraction (HR-XRD) technique. While the crystal peak of Pt is observed in all sample stack that is oriented as (111) face-centered cubic crystal structure, a very weak and broad alpha-Ta (110) peak is observed when Ta layer thickness is above 0.8 nm. Magneto-optical Kerr effect (MOKE) measurements show that the PMA could be enhanced by inserting Ta layer between Pt and CoFeB layer. The magnetically dead layer thickness (t(dead)) and the interfacial anisotropy energy density (K-i) of the various Ta-inserted layer thickness were found as 0.135 nm; 0.75 erg/cm(2), 0.141 nm; 1.02 erg/cm(2), 0.187 nm; 1.15 erg/cm(2), for t(Ta) = 0.0, 0.5, and 1.0 nm, respectively. Both t(dead) and K-i increase with Ta-inserted layer thickness in Pt/Ta(t)/CoFeB/MgO multilayer film stack. The sources of interfacial magnetic anisotropy can be hybridization, crystallinity properties, and/or B/Ta diffusion effect at the interfaces in Pt/Ta(t)/CoFeB/MgO multilayer film stack.
dc.description.sponsorshipAdana Alparslan Turkes Science and Technology University Scientific Research Council [19103008]
dc.description.sponsorshipThis work was supported by Adana Alparslan Turkes Science and Technology University Scientific Research Council under Project No: 19103008.
dc.identifier.doi10.1007/s10854-020-04831-4
dc.identifier.endpage23043
dc.identifier.issn0957-4522
dc.identifier.issn1573-482X
dc.identifier.issue24
dc.identifier.scopus2-s2.0-85095849640
dc.identifier.scopusqualityQ2
dc.identifier.startpage23037
dc.identifier.urihttps://doi.org/10.1007/s10854-020-04831-4
dc.identifier.urihttps://hdl.handle.net/20.500.14669/3299
dc.identifier.volume31
dc.identifier.wosWOS:000588614600002
dc.identifier.wosqualityQ3
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherSpringer
dc.relation.ispartofJournal of Materials Science-Materials in Electronics
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_20241211
dc.subjectPerpendıcular Magnetızatıon
dc.subjectMgo
dc.subjectOrıgın
dc.titleEffect of Ta insertion between Pt and CoFeB on interfacial magnetic anisotropy in Pt/CoFeB/MgO multilayer thin-film stack
dc.typeArticle

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