Enhancing near-infrared sensitivity of CMOS image sensors using a hemispherical photon-trapping structure

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dc.authoridYucekul, Mustafa Ozber/0000-0003-1838-4922
dc.contributor.authorYucekul, Mustafa Ozber
dc.contributor.authorTanrikulu, Mahmud Yusuf
dc.date.accessioned2026-02-27T07:32:57Z
dc.date.available2026-02-27T07:32:57Z
dc.date.issued2025
dc.description.abstractCMOS image sensors are extensively utilized in applications ranging from consumer electronics to biomedical imaging and autonomous systems. Despite their high efficiency in the visible spectrum, their sensitivity in the near-infrared (NIR) region remains significantly low due to the limited absorption of silicon beyond 700 nm. To address this challenge, we propose a novel light-trapping strategy incorporating a hemispherical structure at the silicon interface. This design facilitates the direct transmission of normally incident light into the silicon layer while enhancing light scattering and redistribution. Additionally, a pyramidal structure positioned below the silicon layer refracts transmitted light, further improving absorption. To minimize optical crosstalk between adjacent pixels, a deep trench isolation (DTI) structure is implemented. The optical performance of the proposed structure is evaluated through finite-difference time-domain (FDTD) simulations, demonstrating up to a 36% enhancement in optical efficiency at a wavelength of 1100 nm compared to conventional BSI CMOS image sensor designs. These findings highlight the potential of hemispherical photon-trapping strategies for enhancing CMOS image sensor performance in NIR applications such as machine vision and biomedical imaging.
dc.identifier.doi10.1007/s10825-025-02372-9
dc.identifier.issn1569-8025
dc.identifier.issn1572-8137
dc.identifier.issue4
dc.identifier.urihttp://dx.doi.org/10.1007/s10825-025-02372-9
dc.identifier.urihttps://hdl.handle.net/20.500.14669/4393
dc.identifier.volume24
dc.identifier.wosWOS:001512353900004
dc.indekslendigikaynakWeb of Science
dc.language.isoen
dc.publisherSpringer
dc.relation.ispartofJournal of Computational Electronics
dc.relation.publicationcategoryMakale - Uluslararas� Hakemli Dergi - Kurum ��retim Eleman�
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_20260302
dc.subjectCMOS image sensors
dc.subjectLight trapping
dc.subjectNIR
dc.subjectHemispherical structure
dc.titleEnhancing near-infrared sensitivity of CMOS image sensors using a hemispherical photon-trapping structure
dc.typeArticle

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