An extremely fast pattern based line detector
| dc.contributor.author | Baykal, I. Cem | |
| dc.contributor.author | Yilmaz, I.C. | |
| dc.date.accessioned | 2025-01-06T17:29:42Z | |
| dc.date.available | 2025-01-06T17:29:42Z | |
| dc.date.issued | 2017 | |
| dc.description | 13th IEEE International Conference on Intelligent Computer Communication and Processing, ICCP 2017 -- 7 September 2017 through 9 September 2017 -- Cluj-Napoca -- 132666 | |
| dc.description.abstract | This article describes a completely new, fully automatic line detector algorithm that takes advantage of look-up tables to recognize and fit straight line patterns. The algorithm first recognizes any possible 4×4 pixel line patterns among the binary edge pixels and then uses several small look up tables to decide whether the connected patterns form a line or not. It is designed for real time processing of high resolution images such as the ones used in computer vision applications. The algorithm's system on chip implementation is even cheaper and faster making it especially valuable for battery operated mobile robot applications. Based on the benchmarks, at the time of the writing, this algorithm is the fastest line detector in the literature. © 2017 IEEE. | |
| dc.identifier.doi | 10.1109/ICCP.2017.8117032 | |
| dc.identifier.endpage | 376 | |
| dc.identifier.isbn | 978-153863368-7 | |
| dc.identifier.scopus | 2-s2.0-85041435179 | |
| dc.identifier.startpage | 369 | |
| dc.identifier.uri | https://doi.org/10.1109/ICCP.2017.8117032 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14669/1288 | |
| dc.indekslendigikaynak | Scopus | |
| dc.language.iso | en | |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | |
| dc.relation.ispartof | Proceedings - 2017 IEEE 13th International Conference on Intelligent Computer Communication and Processing, ICCP 2017 | |
| dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | |
| dc.rights | info:eu-repo/semantics/closedAccess | |
| dc.snmz | KA_20241211 | |
| dc.subject | Feature Extraction | |
| dc.subject | Line Detector | |
| dc.subject | Segmentation | |
| dc.title | An extremely fast pattern based line detector | |
| dc.type | Conference Object |
