Physical properties of Cu2O thin films prepared by silar method
| dc.authorid | Gunes, Mustafa/0000-0002-7974-0540 | |
| dc.authorid | Ozaslan, Dogan/0000-0001-5947-4663 | |
| dc.contributor.author | Ozaslan, Dogan | |
| dc.contributor.author | Gunes, Mustafa | |
| dc.contributor.author | Gumus, Cebrail | |
| dc.date.accessioned | 2025-01-06T17:44:21Z | |
| dc.date.available | 2025-01-06T17:44:21Z | |
| dc.date.issued | 2017 | |
| dc.description.abstract | Polycrystalline Cu2O thin films were obtained on glass substrates using by silar method at 70 degrees C. XRD analysis showed the films are a cubic structure and lattice parameters were calculated. The surface morphology of the films were imaged by FE-SEM (Field Emission Scanning Electron Microscope). In order to determine the optical properties of the Cu2O thin films UV/vis spectrophotometer was used. Optical transmittance (T%) values of the Cu2O films were determined in the wavelength range 300-1100 nm at room temperature. Semiconductor Cu20 of the thin films optical transmittance values were found to be 50-70% in the visible region. Energy band gap values (E-g) of the films were found to be 2.53-2.62 eV. | |
| dc.identifier.doi | 10.5505/pajes.2016.58672 | |
| dc.identifier.endpage | 857 | |
| dc.identifier.issn | 1300-7009 | |
| dc.identifier.issn | 2147-5881 | |
| dc.identifier.issue | 7 | |
| dc.identifier.startpage | 854 | |
| dc.identifier.uri | https://doi.org/10.5505/pajes.2016.58672 | |
| dc.identifier.uri | https://hdl.handle.net/20.500.14669/3022 | |
| dc.identifier.volume | 23 | |
| dc.identifier.wos | WOS:000443172200007 | |
| dc.identifier.wosquality | N/A | |
| dc.indekslendigikaynak | Web of Science | |
| dc.language.iso | tr | |
| dc.publisher | Pamukkale Univ | |
| dc.relation.ispartof | Pamukkale University Journal of Engineering Sciences-Pamukkale Universitesi Muhendislik Bilimleri Dergisi | |
| dc.relation.publicationcategory | Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı | |
| dc.rights | info:eu-repo/semantics/openAccess | |
| dc.snmz | KA_20241211 | |
| dc.subject | Silar method | |
| dc.subject | Thin film | |
| dc.subject | Cu2O | |
| dc.subject | Physical properties | |
| dc.title | Physical properties of Cu2O thin films prepared by silar method | |
| dc.type | Article |
