Yilmaz, S.Basol, B. M.Polat, I.Daday, M. TaykurtTomakin, M.Kucukomeroglu, T.Bacaksiz, E.2025-04-092025-04-0920250921-51071873-494410.1016/j.mseb.2025.118208http://dx.doi.org/10.1016/j.mseb.2025.118208https://hdl.handle.net/20.500.14669/4297Close space sublimated CdTe and Cd1-xZnxTe (CZT) films were grown on glass substrates and CdCl2 activation was applied on these films to improve their physical, optical and electrical characteristics for photodetector applications. X-ray diffraction data showed that CdCl2 treatment of CdTe caused a reduction in the dislocation density and microstrain, whereas Zn incorporation/CdCl2 treatment slightly increased these values compared to the as-deposited CdTe films. Morphological examination indicated that CdCl2 activation transformed grains from faceted to rounded shape for both CdTe and CZT films. A band gap enlargement was observed from 1.45 eV to 1.47 eV for both CdTe and CZT films upon CdCl2 treatment. CdCl2-treated CZT films were used to fabricate photodetectors that exhibited the highest performance with a rise/fall time of 27/28 ms, sensitivity of 1301 %, responsivity of 0.0143 A/W, detectivity of 5.7x107 Jones and external quantum efficiency of 4.0 % under blue light illumination at 2 V.eninfo:eu-repo/semantics/closedAccessCdTe and CZT thin filmsCSSCdCl 2 treatmentPhotodetectorArticle317WOS:001444710300001